Static Damage

There are two sources of static damage to electronic devices:

1. EOS [Electrostatic OverStress]

EOS occurs when an electronic device is exposed to a strong static electric field generated by a static charge. Internal electronic components stressed beyond their designed tolerances may fail immediately or have reduced service lives.

2. ESD [ElectroStatic Discharge]

ESD occurs when two objects of different electrostatic potentials are brought close enough together to allow a charge transfer. ESD is the sudden discharge of this electrostatic potential from one body to another. If the discharge current exceeds designed tolerances, damage may cause immediate failure or result in reduced service life.